SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 84, Issue 16, 2004, Pages 3043-3045

Electrical characterization of zinc oxide thin films by electrochemical capacitance-voltage profiling

(5) Tang, X a Clauzonnier, A a Campbell, H I a Prior, K A a Cavenett, B C a

a HERIOT WATT UNIVERSITY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARRIER CONCENTRATION; ELECTRIC POTENTIAL; ELECTROCHEMISTRY; FILM GROWTH; HALL EFFECT; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTOELECTRONIC DEVICES; ZINC OXIDE;

ELECTRICAL CHARACTERIZATION; ELECTROCHEMICAL CAPACITANCE-VOLTAGE PROFILING; ELECTROCHEMICAL ETCHANT; HALL MEASUREMENTS;

THIN FILMS;

EID: 2442566424 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1695442 Document Type: Article

Times cited : (10)

References (8)

1
- 2542422532
- D. M. Bagnall, Y. F. Chen, Z. Zhu, T. Yao, S. Koyama, M. Y. Shen, and T. Goto, Appl. Phys. Lett. 70, 2230 (1997).
- (1997) Appl. Phys. Lett. , vol.70 , pp. 2230
- Bagnall, D.M.¹ Chen, Y.F.² Zhu, Z.³ Yao, T.⁴ Koyama, S.⁵ Shen, M.Y.⁶ Goto, T.⁷

2
- 0142109458
- Z. K. Tang, G. K. L. Wong, P. Yu, M. Kawasaki, H. Ohtomo, H. Koinuma, and Y. Segawa, Appl. Phys. Lett. 72, 3270 (1998).
- (1998) Appl. Phys. Lett. , vol.72 , pp. 3270
- Tang, Z.K.¹ Wong, G.K.L.² Yu, P.³ Kawasaki, M.⁴ Ohtomo, H.⁵ Koinuma, H.⁶ Segawa, Y.⁷

3
- 1542713832
- D. M. Bagnall, Y. F. Chen, Z. Zhu, T. Yao, M. Y. Shen, and T. Goto, Appl. Phys. Lett. 73, 1038 (1998).
- (1998) Appl. Phys. Lett. , vol.73 , pp. 1038
- Bagnall, D.M.¹ Chen, Y.F.² Zhu, Z.³ Yao, T.⁴ Shen, M.Y.⁵ Goto, T.⁶

4
- 0000632622
- Y. Chen, H. Ko, S. Hong, and T. Yao, Appl. Phys. Lett. 76, 559 (2000).
- (2000) Appl. Phys. Lett. , vol.76 , pp. 559
- Chen, Y.¹ Ko, H.² Hong, S.³ Yao, T.⁴

5
- 0035388902
- K. Ogata, T. Kawanishi, K. Maejima, Sz. Fujita, and Sg. Fujita, Jpn. J. Appl. Phys., Part 2 40, L657 (2001).
- (2001) Jpn. J. Appl. Phys., Part 2 , vol.40
- Ogata, K.¹ Kawanishi, T.² Maejima, K.³ Fujita, Sz.⁴ Fujita, Sg.⁵

6
- 0004052502
- Academic, London
- P. Blood and J. W. Orton, The Electrical Characterization of Semiconductors: Majority Carriers and Electron States (Academic, London, 1992).
- (1992) The Electrical Characterization of Semiconductors: Majority Carriers and Electron States
- Blood, P.¹ Orton, J.W.²

7
- 0342643529
- S. Y. Wang, F. Harran, J. Simpson, H. Stewart, J. M. Wallace, K. A. Prior, and B. C. Cavenett, Appl. Phys. Lett. 60, 344 (1992).
- (1992) Appl. Phys. Lett. , vol.60 , pp. 344
- Wang, S.Y.¹ Harran, F.² Simpson, J.³ Stewart, H.⁴ Wallace, J.M.⁵ Prior, K.A.⁶ Cavenett, B.C.⁷

8
- 0037132304
- D. Gerthsen, D. Litvinov, Th. Gruber, C. Kirchner, and A. Waag, Appl. Phys. Lett. 81, 3972 (2002).
- (2002) Appl. Phys. Lett. , vol.81 , pp. 3972
- Gerthsen, D.¹ Litvinov, D.² Gruber, Th.³ Kirchner, C.⁴ Waag, A.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.