Morphotropic phase boundary (MPB) effect in Pb (Zr,Ti)O3 rhombohedral/tetragonal multilayered films

Materials Letters

Volumn 60, Issue 21-22, 2006, Pages 2733-2737

  Zheng, Fengang ^a,b   Chen, Jianping ^a   Li, Xinwan ^a   Shen, Mingrong ^b  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

^b SOOCHOW UNIVERSITY   (China)

Author keywords

MPB; Multilayer; PZT; Sol gel

Indexed keywords

DIELECTRIC PROPERTIES; FERROELECTRICITY; LEAD COMPOUNDS; PERMITTIVITY; PIEZOELECTRIC MATERIALS;

MPB; POLARIZATION ENHANCEMENT; PZT;

MULTILAYERS;

EID: 33745727306     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2006.01.080     Document Type: Article

References (18)

1. Scott J.F. Ferroelectric Memories (2000), Springer, New York
2. Grinberg I., Cooper V.R., and Rappe A.M. Nature (London) 419 (2002) 909
3. Rabe K.M. Nat. Mater. 1 (2002) 147
4. Noheda B., Cox D.E., Shirane G., Gonzalo J.A., Cross L.E., and Park S.E. Appl. Phys. Lett. 74 (1999) 2059
5. Noheda B., Cox D.E., Shirane G., Park S.E., Cross L.E., and Zhong Z. Phys. Rev. Lett. 86 (2001) 3891
6. Noheda B., Cox D.E., Shirane G., Guo R., Jones B., and Cross L.E. Phys. Rev., B 63 (2001) 014013
7. Kim J., Kim Y., Kim Y.S., Lee J., Kim L., and Jung D. Appl. Phys. Lett. 80 (2002) 3581
8. Catalan G., O'Neill D., Bowman R.M., and Gregg J.M. Appl. Phys. Lett. 77 (2000) 3078
9. Xu R., Shen M.R., Ge S.B., Gan Z.Q., and Cao W.W. Thin Solid Films 406 (2002) 113
10. Erbil A., Kim Y., and Gerhardt R.A. Phys. Rev. Lett. 77 (1996) 1628
11. Lu Y. Appl. Phys. Lett. 85 (2004) 979
12. Lee S.G., and Lee Y.H. Thin Solid Films 353 (1999) 244
13. Kim K.T., Kim C.I., and Lee S.G. Microelectron. Eng. 66 (2003) 662
14. Wang C., Fang Q.F., Zhu Z.G., Jiang A.Q., Wang S.Y., Cheng B.L., and Chen Z.H. Appl. Phys. Lett. 82 (2003) 2880
15. Pontes F.M., Longo E., Leite E.R., and Varela J.A. Appl. Phys. Lett. 84 (2004) 5470
16. Zhou Z.H., Xue J.M., Li W.Z., Wang J., Zhu H., and Miao J.M. J. Appl. Phys. 96 (2004) 5706
17. Lian L., and Sottos N.R. J. Appl. Phys. 87 (2000) 3941
18. Udayakumar K.R., Schuele P.J., Chen J., Krupanidhi S.B., and Cross L.E. J. Appl. Phys. 77 (1995) 3981