Nanomechanical characteristics of BaxSr1-xTiO3 thin films

Materials Science and Engineering: B

Volumn 131, Issue 1-3, 2006, Pages 281-284

  Jian, Sheng Rui ^a   Chang, Win Jin ^b   Fang, Te Hua ^c   Ji, Liang Wen ^c   Hsiao, Yu Jen ^d   Chang, Yee Shin ^c  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b KUN SHAN UNIVERSITY   (Taiwan)

^c NATIONAL FORMOSA UNIVERSITY   (Taiwan)

^d NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

AFM; BST; XRD

Indexed keywords

ATOMIC FORCE MICROSCOPY; BARIUM TITANATE; CRYSTALLINE MATERIALS; CURRENT DENSITY; ELASTIC MODULI; GRAIN SIZE AND SHAPE; SILICON; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINE STRUCTURE; METALORGANIC DEPOSITION METHOD; NANOMECHANICAL PROPERTIES; SILICON SUBSTRATE;

THIN FILMS;

EID: 33745678032     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2006.03.025     Document Type: Article

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