Curie-Weiss-type law for the strain and stress effects on the dielectric response of ferroelectric thin films

Applied Physics Letters

Volumn 77, Issue 16, 2000, Pages 2596-2598

  Pertsev, N A ^a,b   Koukhar, V G ^a   Waser, R ^b   Hoffmann, S ^b  

^a IOFFE INSTITUTE   (Russian Federation)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000357795     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1318934     Document Type: Article

References (20)

1. N. Setter and R. Waser, Acta Mater. 48, 151 (2000).
2. Y. Yano, K. Iijima, Y. Daitoh, T. Terashima, Y. Bando, Y. Watanabe, H. Kasatani, and H. Terauchi, J. Appl. Phys. 76, 7833 (1994); T. Kawakubo, S. Komatsu, K. Abe, K. Sano, N. Yanase, and N. Fukushima, Jpn. J. Appl. Phys., Part 1 37, 5108 (1998).
3. Y. Yano, K. Iijima, Y. Daitoh, T. Terashima, Y. Bando, Y. Watanabe, H. Kasatani, and H. Terauchi, J. Appl. Phys. 76, 7833 (1994); T. Kawakubo, S. Komatsu, K. Abe, K. Sano, N. Yanase, and N. Fukushima, Jpn. J. Appl. Phys., Part 1 37, 5108 (1998).
4. N. A. Pertsev, A. G. Zembilgotov, and A. K. Tagantsev, Phys. Rev. Lett. 80, 1988 (1998).
5. N. A. Pertsev, A. G. Zembilgotov, and A. K. Tagantsev, Ferroelectrics 223, 79 (1999).
6. J. S. Speck and W. Pompe, J. Appl. Phys. 76, 466 (1994).
7. Y. Yoneda, T. Okabe, K. Sakaue, H. Terauchi, H. Kusatani, and K. Deguchi, J. Appl. Phys. 83, 2458 (1998).
8. T. M. Shaw, Z. Suo, M. Huang, E. Liniger, R. B. Laibowitz, and J. D. Baniecki, Appl. Phys. Lett. 75, 2129 (1999).
9. N. A. Pertsev, A. G. Zembilgotov, S. Hoffmann, R. Waser, and A. K. Tagantsev, J. Appl. Phys. 85, 1698 (1999).
10. The sets of BT and PT material parameters listed in Ref. 4 were used in the computations.
11. N. A. Pertsev and V. G. Koukhar, cond-mat/9907391, (1999); Phys. Rev. Lett. 84, 3722 (2000).
12. N. A. Pertsev and V. G. Koukhar, cond-mat/9907391, (1999); Phys. Rev. Lett. 84, 3722 (2000).
13. N. A. Pertsev and A. G. Zembilgotov, J. Appl. Phys. 78, 6170 (1995); A. E. Romanov, W. Pompe, and J. S. Speck, ibid 79, 4037 (1996).
14. N. A. Pertsev and A. G. Zembilgotov, J. Appl. Phys. 78, 6170 (1995); A. E. Romanov, W. Pompe, and J. S. Speck, ibid 79, 4037 (1996).
15. 2 domains lies along one of the in-plane edges of the prototypic cubic cell.
16. S. K. Streiffer, C. Basceri, C. B. Parker, S. E. Lash, and A. I. Kingon, J. Appl. Phys. 86, 4565 (1999).
17. S. Hoffmann and R. Waser, J. Phys. IV 8, 9 (1998).
18. A. D. Hilton and B. W. Ricketts, J. Phys. D 29, 1321 (1996).
19. N. A. Pertsev, A. K. Tagantsev, and N. Setter, Phys. Rev. B 61, R825 (2000).
20. The fact that σ* is still almost one order of magnitude smaller than the experimental estimate may be attributed to the reduction of permittivity and its stress sensitivity in polycrystalline films relative to the single crystalline ones, which is not taken into account in our calculations.