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Volumn 6151 II, Issue , 2006, Pages

New contamination experimental equipment in the NewSUBARU and evaluation of Si-capped multilayer mirrors using it

Author keywords

Contamination; EUVL; Lifetime; Mirror; Mo Si; Multilayer

Indexed keywords

CONTAMINATION; LITHOGRAPHY; MULTILAYERS; SYNCHROTRON RADIATION; TEST FACILITIES; ULTRAVIOLET RADIATION;

EID: 33745601929     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.656845     Document Type: Conference Paper
Times cited : (5)

References (9)
  • 1
    • 33745587686 scopus 로고    scopus 로고
    • Ed, by SEMATECH, Nov. 7-9 San Diego, CA, USA
    • Ed, by SEMATECH, Proc. 4th EUVL Symp., Nov. 7-9 2005 San Diego, CA, USA.
    • (2005) Proc. 4th EUVL Symp.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.