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Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 1196-1199

Optical properties of microcrystalline 3C-SiC:H films measured by resonant photothermal bending spectroscopy

Author keywords

68.60.Wm; 68.88.Ln; 78.20.Ci; 78.40.Fy; Absorption; Microcrystallinity; Optical spectroscopy; Silicon

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; CHEMICAL VAPOR DEPOSITION; ESTIMATION; HYDROGENATION; LIGHT ABSORPTION; SILICON;

EID: 33745459205     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.01.074     Document Type: Article
Times cited : (11)

References (13)
  • 6
    • 6344228521 scopus 로고    scopus 로고
    • T. Kunii, T. Kiriyama, K. Mori, N. Yoshida, S. Nonomura, In: Proceedings of the Third World Conference on Photovoltaic Energy Conversion, 2003, 1683.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.