SCOPUS 정보 검색 플랫폼

Volumn 457-460, Issue I, 2004, Pages 657-660

Optical investigation of the built-in strain in 30-SiC epilayers

Author keywords

30 SiC heteroepitaxy; Photoluminescence; Stress

Indexed keywords

CARBONIZATION; EPITAXIAL GROWTH; IMAGING TECHNIQUES; PHOTOLUMINESCENCE; STRESSES; THERMAL EXPANSION;

3C-SIC HETEROEPITAXY; BAND-GAP EMISSIONS; ENERGY GAPS; RESIDUAL STRAIN;

SILICON CARBIDE;

EID: 8744254630 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: None Document Type: Conference Paper

Times cited : (4)

References (16)

1
- 0035119633
- T. Chassagne, G. Ferro, C. Gourbeyre, M. Le Berre, D. Barbier and Y. Monteil: Mater. Sci. Forum Vols. 353-356 (2001), p. 155.
- (2001) Mater. Sci. Forum , vol.353-356 , pp. 155
- Chassagne, T.¹ Ferro, G.² Gourbeyre, C.³ Le Berre, M.⁴ Barbier, D.⁵ Monteil, Y.⁶

2
- 8744287738
- A. Matsuura, Y. Masuda, Y. Chen and S. Nishino: Mater. Sci. Forum Vols. 353-356 (2001), p. 495.
- (2001) Mater. Sci. Forum , vol.353-356 , pp. 495
- Matsuura, A.¹ Masuda, Y.² Chen, Y.³ Nishino, S.⁴

3
- 0000202296
- H.W. Shim, K.C. Kim, Y.H. Seo, K.S. Nahm, E.K. Suh, H.J. Lee, and Y.G. Hwang: Appl. Phys. Lett. Vol. 70 (1997), p. 1757.
- (1997) Appl. Phys. Lett. , vol.70 , pp. 1757
- Shim, H.W.¹ Kim, K.C.² Seo, Y.H.³ Nahm, K.S.⁴ Suh, E.K.⁵ Lee, H.J.⁶ Hwang, Y.G.⁷

4
- 0027927258
- T. Matsumoto, J. Takahashi, T. Tamaki, T. Futagi, H. Himura, and Y. Kanemitsu: Appl. Phys. Lett. Vol. 64 (1994), p. 226.
- (1994) Appl. Phys. Lett. , vol.64 , pp. 226
- Matsumoto, T.¹ Takahashi, J.² Tamaki, T.³ Futagi, T.⁴ Himura, H.⁵ Kanemitsu, Y.⁶

5
- 0029305117
- L. S. Liao, X. M. Bao, Z. F. Yang, and N. B. Min: Appl. Phys. Lett. Vol. 66 (1995), p. 2382.
- (1995) Appl. Phys. Lett. , vol.66 , pp. 2382
- Liao, L.S.¹ Bao, X.M.² Yang, Z.F.³ Min, N.B.⁴

6
- 0029293195
- A. O. Konstantinov, A. Henry, C.I. Harris, and E. Janzen: Appl. Phys. Lett. Vol. 66 (1995), p. 2250.
- (1995) Appl. Phys. Lett. , vol.66 , pp. 2250
- Konstantinov, A.O.¹ Henry, A.² Harris, C.I.³ Janzen, E.⁴

7
- 0028513934
- H. Tamura, M. Rueckschloss, T. Wirschem, and S. Veprek: Appl. Phys. Lett. Vol. 65 (1994), p. 1537.
- (1994) Appl. Phys. Lett. , vol.65 , pp. 1537
- Tamura, H.¹ Rueckschloss, M.² Wirschem, T.³ Veprek, S.⁴

8
- 0000239644
- H. Munekata, S. Murasato, and H. Kukimoto: Appl. Phys. Lett. Vol. 37 (1980), p. 536.
- (1980) Appl. Phys. Lett. , vol.37 , pp. 536
- Munekata, H.¹ Murasato, S.² Kukimoto, H.³

9
- 21544455021
- D. L. Staebler and C. R. Wronsky: Appl. Phys. Lett. Vol. 31 (1977), p. 292.
- (1977) Appl. Phys. Lett. , vol.31 , pp. 292
- Staebler, D.L.¹ Wronsky, C.R.²

10
- 4243798052
- M. Stutzmann, W. B. Jackson, and C. C. Tsai: Phys. Rev. B Vol. 32 (1985), p. 23.
- (1985) Phys. Rev. B , vol.32 , pp. 23
- Stutzmann, M.¹ Jackson, W.B.² Tsai, C.C.³

11
- 0000615173
- W. J. Choyke, Z. C. Feng, and J. A. Powell: J. Appl. Phys. Vol. 64 (1988), p. 3163.
- (1988) J. Appl. Phys. , vol.64 , pp. 3163
- Choyke, W.J.¹ Feng, Z.C.² Powell, J.A.³

12
- 36449003552
- H. Itoh, M. Yoshikawa, I. Nashiyama, H. Okumura, S. Misawa, and S. Yoshida: J. Appl. Phys. Vol. 77 (1995), p. 837.
- (1995) J. Appl. Phys. , vol.77 , pp. 837
- Itoh, H.¹ Yoshikawa, M.² Nashiyama, I.³ Okumura, H.⁴ Misawa, S.⁵ Yoshida, S.⁶

13
- 0021587519
- P. Liaw and R. F. Davis: J. Electrochem. Soc. Vol. 131(1988), p. 3014.
- (1988) J. Electrochem. Soc. , vol.131 , pp. 3014
- Liaw, P.¹ Davis, R.F.²

14
- 0000748934
- C. H. Park, B. H. Cheong, K. H. Lee, and K. J. Chang: Phys. Rev. B Vol. 49 (1994), p. 4485.
- (1994) Phys. Rev. B , vol.49 , pp. 4485
- Park, C.H.¹ Cheong, B.H.² Lee, K.H.³ Chang, K.J.⁴

15
- 0005595837
- W. J. Choyke: NATO ASI Series E, Applied Sciences, Vol. 185 (1990), p. 563.
- (1990) NATO ASI Series E, Applied Sciences , vol.185 , pp. 563
- Choyke, W.J.¹

16
- 0000022752
- P. Lautenschlager, P. B. Allen, and M. Cordona: Phys. Rev. B Vol. 31 (1985), p. 2163.
- (1985) Phys. Rev. B , vol.31 , pp. 2163
- Lautenschlager, P.¹ Allen, P.B.² Cordona, M.³

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