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Volumn 2005, Issue , 2005, Pages 165-170

LTCC resistors and resistive temperature sensors - Chosen electrical and stability properties

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; ELECTRIC RESISTANCE; HEAT RESISTANCE; SENSORS; TEMPERATURE MEASUREMENT; THERMODYNAMIC STABILITY;

EID: 33745452400     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSE.2005.1491023     Document Type: Conference Paper
Times cited : (8)

References (17)
  • 6
    • 0036540880 scopus 로고    scopus 로고
    • Electrical and structural investigations in reliability characterisation of modeRN passives and passive integrated components
    • A. Dziedzic, "Electrical and structural investigations in reliability characterisation of modeRN passives and passive integrated components", Microelectron. Reliab., vol.42 (2002) 709-719
    • (2002) Microelectron. Reliab. , vol.42 , pp. 709-719
    • Dziedzic, A.1
  • 7
    • 33745450639 scopus 로고    scopus 로고
    • Thick-film thermistors and thermoresistors
    • in Polish
    • A. Dziedzic et al.; "Thick-film thermistors and thermoresistors", Elektronizacja, no 1'97, p. 5-8 (in Polish)
    • Elektronizacja , vol.1 , Issue.97 , pp. 5-8
    • Dziedzic, A.1
  • 11
    • 33745441442 scopus 로고    scopus 로고
    • Thick-film temperature sensors on alumina and LTCC substrates
    • in print
    • M. Hrovat et al.; "Thick-film temperature sensors on alumina and LTCC substrates", J. European Ceramic Society (in print)
    • J. European Ceramic Society
    • Hrovat, M.1
  • 12
    • 0036890350 scopus 로고    scopus 로고
    • On the analytical description of ageing kinetics in ceramic manganite-based MTC thermistors
    • V.O. Balitska, B. Butkievich, O.I. Shpotyuk, M.M. Vakiv: "On the analytical description of ageing kinetics in ceramic manganite-based MTC thermistors", Microelectron. Reliab., vol.42 (2002 ), p.2003-2007
    • (2002) Microelectron. Reliab. , vol.42 , pp. 2003-2007
    • Balitska, V.O.1    Butkievich, B.2    Shpotyuk, O.I.3    Vakiv, M.M.4
  • 13
    • 27744449411 scopus 로고    scopus 로고
    • Effects of firing conditions on thick-film PTC thermistor characteristics in LTCC technology
    • Denver
    • H. Birol, T. Maeder, C. Jacq, P. Ryser; "Effects of firing conditions on thick-film PTC thermistor characteristics in LTCC technology", Proc. IMAPS Ceramic Interconnect Technology Conf., Denver 2004, p. 106-109
    • (2004) Proc. IMAPS Ceramic Interconnect Technology Conf. , pp. 106-109
    • Birol, H.1    Maeder, T.2    Jacq, C.3    Ryser, P.4
  • 16
    • 27744603558 scopus 로고    scopus 로고
    • Evaluation of compatibility of thick-film PTC thermistors and LTCC structures
    • in print
    • D. Belavič et al.; Evaluation of compatibility of thick-film PTC thermistors and LTCC structures, Microelectron. Reliab. (in print)
    • Microelectron. Reliab.
    • Belavič, D.1
  • 17
    • 33745450882 scopus 로고    scopus 로고
    • Some remarks about relations between processing conditions and microstructural, electrical as well as stability properties of LTCC resistors
    • Prague, June
    • A. Dziedzic et al.; "Some remarks about relations between processing conditions and microstructural, electrical as well as stability properties of LTCC resistors", Proc. European Microelectronics and Packaging Symposium, Prague, June 2004, p.345-354
    • (2004) Proc. European Microelectronics and Packaging Symposium , pp. 345-354
    • Dziedzic, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.