Evaluation of compatibility of thick-film PTC thermistors and LTCC structures

Microelectronics Reliability

Volumn 45, Issue 12, 2005, Pages 1924-1929

  Belavič, Darko ^a   Hrovat, Marko ^b   Kita, Jaroslaw ^c   Holc, Janez ^b   Cilenšek, Jena ^b   Golonka, Leszek ^c   Dziedzic, Andrzej ^c  

^a doo   (Slovenia)

^b JO EF STEFAN INSTITUTE   (Slovenia)

^c WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

MICROANALYSIS; MICROELECTRONICS; RUTHENIUM; THICK FILMS;

ELECTRICAL CHARACTERISTICS; TEMPERATURE COEFFICIENTS; THICK-FILM PTC THERMISTORS;

THERMISTORS;

EID: 27744603558     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2005.03.002     Document Type: Conference Paper

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