A characterization of thick-film PTC resistors

Sensors and Actuators, A: Physical

Volumn 117, Issue 2, 2005, Pages 256-266

  Hrovat, Marko ^a   Belavič, Darko ^b   Benčan, Andreja ^a   Holc, Janez ^a   Dražič, Goran ^a  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b doo   (Slovenia)

Author keywords

Electron microscopy; Firing; PTC thick film resistors; X ray spectra

Indexed keywords

PTC THICK FILM RESISTORS; SHEET RESISTIVITIES; TEMPERATURE COEFFICIENT OF RESISTIVITY (TCR);

DECOMPOSITION; ELECTRIC CONDUCTIVITY; ENERGY DISPERSIVE SPECTROSCOPY; FIRING (OF MATERIALS); HIGH TEMPERATURE EFFECTS; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; THICK FILM DEVICES; TRANSMISSION ELECTRON MICROSCOPY; X RAY POWDER DIFFRACTION;

RESISTORS;

EID: 69749121903     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2004.06.020     Document Type: Article

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