메뉴 건너뛰기




Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 959-963

Plasma diagnostics in silane-methane-hydrogen plasmas under pm-Si1-xCx:H deposition conditions: Correlation with film properties

Author keywords

H2 Fulcher ; Particle formation; Photoluminescence; Plasma diagnostics; Polymorphous silicon carbon; Silicon nanocrystals

Indexed keywords

AGGLOMERATION; DEPOSITION; EMISSION SPECTROSCOPY; NUCLEATION; PHOTOLUMINESCENCE; PLASMA DIAGNOSTICS;

EID: 33745449206     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.12.052     Document Type: Article
Times cited : (8)

References (19)
  • 7
    • 33745443193 scopus 로고    scopus 로고
    • Bouchoule A. (Ed), John Wiley & Sons, Inc., New York
    • In: Bouchoule A. (Ed). Dusty Plasma (1999), John Wiley & Sons, Inc., New York 162, 245
    • (1999) Dusty Plasma


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.