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Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 959-963
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Plasma diagnostics in silane-methane-hydrogen plasmas under pm-Si1-xCx:H deposition conditions: Correlation with film properties
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Author keywords
H2 Fulcher ; Particle formation; Photoluminescence; Plasma diagnostics; Polymorphous silicon carbon; Silicon nanocrystals
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Indexed keywords
AGGLOMERATION;
DEPOSITION;
EMISSION SPECTROSCOPY;
NUCLEATION;
PHOTOLUMINESCENCE;
PLASMA DIAGNOSTICS;
H2 FULCHER Α;
PARTICLE FORMATION;
POLYMORPHOUS SILICON CARBON;
SILICON NANOCRYSTALS;
NANOSTRUCTURED MATERIALS;
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EID: 33745449206
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2005.12.052 Document Type: Article |
Times cited : (8)
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References (19)
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