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Japanese Journal of Applied Physics, Part 2: Letters

Volumn 45, Issue 20-23, 2006, Pages

Activation energy of oxygen vacancy diffusion of yttria-stabilized-zirconia thin film determined from DC current measurements below 150©C

(6) Wakiya, Naoki a Tajiri, Naoya a Kiguchi, Takanori a Mizutani, Nobuyasu a Cross, Jeffrey S a,b Shinozaki, Kazuo a

a TOKYO INSTITUTE OF TECHNOLOGY (Japan)

b FUJITSU LABORATORIES LTD (Japan)

Author keywords

Activation energy; Dc current measurements; Film; Yttria stabilized zirconia

Indexed keywords

ACTIVATION ENERGY; CURRENT DENSITY; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENT MEASUREMENT; ELECTRODES; PERMITTIVITY;

CURRENT PEAK; DC CURRENT MEASUREMENTS; OXYGEN VACANCY REDISTRIBUTION; YTTRIA-STABILIZED-ZIRCONIA;

THIN FILMS;

EID: 33745321883 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.45.L525 Document Type: Article

Times cited : (4)

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