Auger spectroscopy and properties of Ir(Pt)/PZT(PZT/PT)/Ir nanosized thin-film structures

Physics of the Solid State

Volumn 48, Issue 6, 2006, Pages 1200-1204

  Afanas'ev, V P ^a   Afanas'ev, P V ^a   Grekhov, I V ^b   Delimova, L A ^b   Kim, S P ^c   Koo, J M ^c   Mashovets, D V ^b   Pankrashkin, A V ^a   Park, Y ^c   Petrov, A A ^a   Shin, S ^c  

^a SAINT PETERSBURG ELECTROTECHNICAL UNIVERSITY LETI   (Russian Federation)

^b IOFFE INSTITUTE   (Russian Federation)

^c Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33745221643     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063783406060588     Document Type: Article

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