Investigation of the electric field distribution in x-ray detectors by Pockels effect

Journal of Optics A: Pure and Applied Optics

Volumn 8, Issue 7, 2006, Pages

  Cola, A ^a   Farella, I ^a   Auricchio, N ^b,c   Caroli, E ^c  

^a CNR   (Italy)

^b UNIVERSITY OF FERRARA   (Italy)

^c OSSERVATORIO ASTRONOMICO DI BOLOGNA   (Italy)

Author keywords

Cadmium telluride; Electric field distribution; Pockels effect; X ray detectors

Indexed keywords

CADMIUM COMPOUNDS; DETECTORS; ELECTRIC CURRENTS; INFRARED RADIATION; SEMICONDUCTOR MATERIALS; X RAYS;

CHARGE-COLLECTION PROPERTIES; ELECTRIC FIELD DISTRIBUTION; GAIN INFORMATION; SPATIAL RESOLUTION;

ELECTRIC FIELDS;

EID: 33745204163     PISSN: 14644258     EISSN: 17413567     Source Type: Journal    
DOI: 10.1088/1464-4258/8/7/S24     Document Type: Article

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