Factors limiting the performance of CdZnTe detectors

IEEE Transactions on Nuclear Science

Volumn 52, Issue 3 I, 2005, Pages 589-598

  Boiotnikov, A E ^a   Camarda, G C ^a   Wright, G W ^a   James, R B ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

CdZnTe (CZT); Gamma ray detectors; Semiconductor radiation detectors

Indexed keywords

CRYSTALS; CURRENT DENSITY; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; ELECTRON MOBILITY; GAMMA RAYS; LEAKAGE CURRENTS; MATHEMATICAL MODELS;

CDZNTE (CZT); ELECTRONIC NOISE; GAMMA-RAY DETECTORS; SEMICONDUCTOR RADIATION DETECTORS;

DETECTORS;

EID: 23844491155     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.851419     Document Type: Article

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