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Journal of Materials Chemistry

Volumn 16, Issue 25, 2006, Pages 2478-2484

An X-ray reflectivity study of evaporation-induced self-assembled titania-based films

(4) Henderson, M J a Gibaud, A b Bardeau, J F b White, J W a

a AUSTRALIAN NATIONAL UNIVERSITY (Australia)

b UNIVERSITÉ DU MAINE (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC HUMIDITY; EVAPORATION; INTERFACES (MATERIALS); SILICON WAFERS; SURFACE ACTIVE AGENTS;

FILM STRUCTURE; STRUCTURAL DEVELOPMENT; TITANIA-BASED FILMS; X-RAY REFLECTIVITY;

TITANIUM COMPOUNDS;

EID: 33745191411 PISSN: 09599428 EISSN: 13645501 Source Type: Journal
DOI: 10.1039/b601677d Document Type: Article

Times cited : (37)

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