Efficient time integration of the Boltzmann-Poisson system applied to semiconductor device simulation

Journal of Computational Electronics

Volumn 5, Issue 1, 2006, Pages 5-14

  Auer, Ch ^a   Schurrer F ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Boltzmann Poisson system; Finite difference WENO scheme; Local time step algorithms; Semiconductor device simulation

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; FINITE DIFFERENCE METHOD; NUMERICAL METHODS; POISSON DISTRIBUTION; RUNGE KUTTA METHODS; SEMICONDUCTOR DEVICE TESTING; TIME SERIES ANALYSIS;

BOLTZMANN-POISSON SYSTEM; HYPERBOLIC CONSERVATION LAWS; LOCAL TIME-STEP ALGORITHMS;

COMPUTER AIDED NETWORK ANALYSIS;

EID: 33745034942     PISSN: 15698025     EISSN: 15728137     Source Type: Journal    
DOI: 10.1007/s10825-006-7914-6     Document Type: Article

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