SCOPUS 정보 검색 플랫폼

Volumn 56, Issue 4, 2002, Pages 308-314

Novel method for the plan-view TEM preparation of thin samples on brittle substrates by mechanical and ion beam thinning

(2) Safran G a Grenet, T b

a INSTITUTE OF EXPERIMENTAL MEDICINE (Hungary)

b CNRS Laboratoire D Études des Poprietés Electroniques des Solides (France)

Author keywords

Brittle substrates; Low risk of brake; Plan view thinning; TEM sample preparation

Indexed keywords

FILM PREPARATION; GLASS SUBSTRATES; GLUES; GLUING; ION BEAMS; IONS; SAPPHIRE;

BREAKINGS; BRITTLE SUBSTRATES; ION BEAM THINNING; LOW RISK OF BRAKE; MECHANICAL; NOVEL METHODS; PLAN-VIEW THINNING; PREPARATION METHOD; TEM SAMPLE PREPARATION; THINNINGS;

MECHANICAL STABILITY;

ARTICLE; DEVICE; FILM; PRIORITY JOURNAL; RADIATION BEAM; TECHNIQUE; THICKNESS; TISSUE PREPARATION; TISSUE SECTION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037083648 PISSN: 1059910X EISSN: None Source Type: Journal
DOI: 10.1002/jemt.10034 Document Type: Article

Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.