메뉴 건너뛰기




Volumn 20, Issue 13, 2006, Pages 787-794

Monte Carlo simulations of electron transport in wurtzite phase GaN MESFET including trapping effect

Author keywords

Buffer layer; Current collapse; Ensemble Monte Carlo; MESFET transistor; Steady state; Trap centers; Wurtzite structure

Indexed keywords


EID: 33744541861     PISSN: 02179849     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0217984906011037     Document Type: Article
Times cited : (14)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.