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Volumn 20, Issue 13, 2006, Pages 787-794
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Monte Carlo simulations of electron transport in wurtzite phase GaN MESFET including trapping effect
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Author keywords
Buffer layer; Current collapse; Ensemble Monte Carlo; MESFET transistor; Steady state; Trap centers; Wurtzite structure
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Indexed keywords
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EID: 33744541861
PISSN: 02179849
EISSN: None
Source Type: Journal
DOI: 10.1142/S0217984906011037 Document Type: Article |
Times cited : (14)
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References (8)
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