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Volumn 34, Issue 1, 2006, Pages 812-817
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Process analysis and optimization on PECVD amorphous silicon on glass substrate
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Author keywords
Amorphous silicon; Deposition rate; Low stress; PECVD
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Indexed keywords
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EID: 33744519554
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/34/1/134 Document Type: Article |
Times cited : (22)
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References (15)
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