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Volumn 34, Issue 1, 2006, Pages 812-817

Process analysis and optimization on PECVD amorphous silicon on glass substrate

Author keywords

Amorphous silicon; Deposition rate; Low stress; PECVD

Indexed keywords


EID: 33744519554     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/34/1/134     Document Type: Article
Times cited : (22)

References (15)
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    • Characterization of masking materials for deep glass micromachining
    • 0960-1317 305
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    • Bien, D.C.S.1
  • 13
    • 0031648043 scopus 로고    scopus 로고
    • Low-temperature anodic bonding using lithium aluminosilicate- - Quartz glass ceramic
    • 10.1016/S0924-4247(97)01659-2 0924-4247 A
    • Shoji S, H Kikuchi and H Torigoe 1997 Low-temperature anodic bonding using lithium aluminosilicate- - quartz glass ceramic Sensors Actuators A 64 95-100
    • (1997) Sensors Actuators , vol.64 , Issue.1 , pp. 95-100
    • Shoji, S.1    Kikuchi, H.2    Torigoe, H.3
  • 14
    • 0034272891 scopus 로고    scopus 로고
    • The introduction of powder blasting for sensors and microsystem application
    • 10.1016/S0924-4247(00)00390-3 0924-4247 A
    • Belloy E, et al 2000 The introduction of powder blasting for sensors and microsystem application Sensors Actuators A 84 330-337
    • (2000) Sensors Actuators , vol.84 , Issue.3 , pp. 330-337
    • Belloy, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.