Electrical activity of deep levels in the presence of InAs/GaAs quantum dots

Materials Science in Semiconductor Processing

Volumn 9, Issue 1-3, 2006, Pages 36-40

  Kaniewska, M ^a   Engstrom O ^b   Barcz, A ^a   Pacholak Cybulska, M ^a  

^a Department of Micro and Nanotechnology of Wide Bandgap Semiconductors   (Poland)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

Defects; DLTS; MBE; SIMS

Indexed keywords

DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRON TRAPS; OPTICAL WAVEGUIDES; POINT DEFECTS; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS;

ELECTRICAL ACTIVITY; NON-HOMOGENOUS SPATIAL DISTRIBUTIONS; OPTICAL AND ELECTRICAL CONFINEMENT;

SEMICONDUCTOR QUANTUM DOTS;

EID: 33744518057     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2006.01.004     Document Type: Article

References (16)

1. Engstrom O., Malmkvist M., Fu Y., Olafsson H.O., and Sveinbjornsson E.O. Appl Phys Lett 83 (2003) 3575
2. Engström O., Kaniewska M., Fu Y., Piscator J., and Malmkvist M. Appl Phys Lett 85 (2004) 2908
3. Kaniewska M., Engström O., Barcz A., and Pacholak-Cybulska M. Mater Sci Eng (2005) in press
4. Yamanaka K., Naritsuka S., Kanamoto K., Mihara M., and Ishii M. J Appl Phys 61 (1987) 5062
5. Martin G.M., Mitonneau A., and Mircea A. Electron Lett 13 (1977) 191
6. Lefevre H., and Schultz M. Appl Phys 12 (1977) 45
7. Kaminska M., and Weber E.R. In: Willardson R.K. (Ed). EL2 defects in GaAs: semiconductors and semimetals vol. 38 (1993), Academic Press Inc., San Diego 59
8. Fukuyama A., Ikari T., Akahasi Y., and Suemitsu M. Phys Rev B 67 (2003) 113202
9. Silveira J.P., Garcia J.M., and Briones F. J Cryst Growth 227-228 (2001) 995
10. Mircea A., Pons D., and Makram-Ebeid S. In: Beleznay F., Ferenchi G., and Giber J. (Eds). Lecture notes in physics vol. 122 (1980), Springer, Berlin 69
11. McAfee S.R., Lang D.V., and Tsang W.T. Appl Phys Lett 40 (1982) 520
12. Prior K.A., Davies G.J., and Heckingbottom R. J Cryst Growth 66 (1984) 55
13. Harmand J.-C., and Juhel M. Appl Phys Lett 62 (1993) 3300
14. Kaniewska M., Klima K., and Barcz A. IEEE (Piscataway, NJ, USA) (2000) 357
15. Kaniewska M., Barcz A., Krynska D., and Wesolowski M. SPIE 4237 (2000) 113
16. Kaniewska M., Krynska D., and Wesolowski M. Opt Mater 17 (2001) 283