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Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 998-1002

Cw argon laser crystallization of silicon films: Structural properties

Author keywords

Crystallization; Defects; Microcrystallinity

Indexed keywords

AMORPHOUS SILICON; CRYSTALLIZATION; DEPOSITION; EPITAXIAL GROWTH; GLASS; LASER BEAM EFFECTS;

EID: 33744508542     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.11.121     Document Type: Article
Times cited : (25)

References (15)
  • 4
    • 33744519416 scopus 로고    scopus 로고
    • J.F. Michaud, R. Rogel, T. Mohammed-Brahim, M. Sarret, O. Bonnaud, Thin Solid Films (in press).
  • 8
    • 33744508416 scopus 로고    scopus 로고
    • A. Saboundji, J.F. Michaud, T. Mohammed-Brahim, O. Bonnaud, G. Andrä, J. Bergmann, F. Falk, in: Proceedings of the AMLCD, Tokyo, Japan, 2004, p. 303.
  • 10
    • 33744523626 scopus 로고    scopus 로고
    • J.F. Michaud, R. Rogel, T. Mohammed-Brahim, M. Sarret, O. Bonnaud, in: Proceedings of the IDW, Niigata, Japan, 2004.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.