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Volumn 16, Issue 5, 2006, Pages 1051-1056

Deep reactive ion etching of borosilicate glass using an anodically bonded silicon wafer as an etching mask

Author keywords

[No Author keywords available]

Indexed keywords

ANTENNAS; CHEMICAL BONDS; DRY ETCHING; INDUCTIVELY COUPLED PLASMA; REACTIVE ION ETCHING; SILICON WAFERS;

EID: 33744461560     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/16/5/024     Document Type: Article
Times cited : (55)

References (8)
  • 1
    • 0029419192 scopus 로고
    • Advanced silicon etching using high density plasmas
    • 10.1117/12.221279 0277-786X
    • Bhardwaj J K and Ashraf H 1995 Advanced silicon etching using high density plasmas Proc. SPIE 2639 224-33
    • (1995) Proc. SPIE , vol.2639 , pp. 224-233
    • Bhardwaj, J.K.1    Ashraf, H.2
  • 2
    • 0004795146 scopus 로고    scopus 로고
    • High etch rate, deep anisotropic plasma etching of silicon for MEMS fabrication
    • 10.1117/12.320159 0277-786X
    • Pandhumsoporn T, Wang L, Feldbaum M and Gadgil P 1998 High etch rate, deep anisotropic plasma etching of silicon for MEMS fabrication Proc. SPIE 3328 93-101
    • (1998) Proc. SPIE , vol.3328 , pp. 93-101
    • Pandhumsoporn, T.1    Wang, L.2    Feldbaum, M.3    Gadgil, P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.