Mismatches after hot-carrier injection in advanced complementary metal-oxide-semiconductor technology particularly for analog applications

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 4 B, 2006, Pages 3266-3271

  Chen, Shuang Yuan ^a   Lin, Jung Chun ^b,c   Chen, Hung Wen ^a   Lin, Hung Chuan ^a   Jhou, Ze Wei ^b   Chou, Sam ^b   Ko, Joe ^b   Lei, Tien Fu ^c   Haung, Heng Sheng ^a  

^a NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^b UNITED MICROELECTRONICS CORPORATION   (Taiwan)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

HCI; Hot carrier; Matching; Mismatch

Indexed keywords

CMOS INTEGRATED CIRCUITS; DEGRADATION; MOSFET DEVICES; STRESSES;

ANALOG CIRCUITS; HOT-CARRIER INJECTION (HCI); MATCHING; MISMATCH;

HOT CARRIERS;

EID: 33646930909     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.3266     Document Type: Article

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