On-line measurement of surface roughness by laser light scattering

Measurement Science and Technology

Volumn 17, Issue 6, 2006, Pages 1496-1502

  Lu, Rong Sheng ^a   Tian, Gui Yun ^a  

^a NONE

Author keywords

Light scattering; On line measurement; One dimensional manufacturing surface; Surface roughness

Indexed keywords

CHARGE COUPLED DEVICES; LASER APPLICATIONS; LIGHT SCATTERING; PROBES; SENSORS;

ON-LINE MEASUREMENT; ONE-DIMENSIONAL MANUFACTURING SURFACE; ROOT-MEAN-SQUARE (RMS);

SURFACE ROUGHNESS;

CHARGE COUPLED DEVICES; LASER APPLICATIONS; LIGHT SCATTERING; PROBES; SENSORS; SURFACE ROUGHNESS;

EID: 33646895863     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/17/6/030     Document Type: Conference Paper

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