Stylus contact method for surface metrology in the ascendancy

Measurement and Control

Volumn 31, Issue 2, 1998, Pages 48-50

  Whitehouse, D J ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTICITY; FRICTION; HARDNESS; INTERFACIAL ENERGY; NANOTECHNOLOGY;

STYLUS CONTACT METHOD;

SURFACE MEASUREMENT;

EID: 0032025112     PISSN: 00202940     EISSN: None     Source Type: Journal    
DOI: 10.1177/002029409803100204     Document Type: Article

References (10)

1. D. J. Whitehouse Handbook of Surface Metrology. Institute of Physics and Rank Taylor Hobson (1994).
2. N. Gane and J.M. Cox. 'The micro hardness of metals at very low loads'. Phil Mag. Vol.22 p.891 (1970).
3. D.J. Whitehouse (1988) A revised philosophy of surface measuring instruments. Proc. IMechE, J. Mech. Eng. Sci Vol.202 p169.
4. D.J. Whitehouse and W.L. Wang (1996) Dynamics and trackability of stylus systems. Proc. Inst. Mech. Engr. Vol. 210 p159-165.
5. D.J. Whitehouse Dynamic aspects of scanning surface instruments and microscopes. Nanotechnology Vol. 2 p.93-102.
6. D.J. Whitehouse (1979) A theoretical investigation of stylus integration. Annals CIRP Vol. 23 p181.
7. Kane and Larrabee (Eds) (1973) Stylus methods 'Characterization of solid surface' page 70 (Plenum Press, New York).
8. G.E. Sommargren 1981 Appl. Optics Vol.20 p610.
9. P. Beckman and Spizzichino (1963) The scattering of Electromagnetic waves from rough surfaces (Oxford, Permagon).
10. H.K. Wickramasinghe (1989) Scanned probe microscopes Sci Am Oct. 74-81.