Width of the specular peak perpendicular to the principal plane for rough surfaces

Applied Optics

Volumn 40, Issue 33, 2001, Pages 6072-6080

  Meister, Gerhard ^a   Rothkirch, André ^b   Spitzer, Hartwig ^b   Bienlein, Johann ^b  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; LIGHT SCATTERING; REMOTE SENSING; SURFACE ROUGHNESS;

ROUGH SURFACES;

LIGHT REFLECTION;

EID: 0037811791     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.006072     Document Type: Article

References (27)

1. J. A. Ogilvy, Theory of Wave Scattering from Random Rough Surfaces (Instituí of Physics Publishing, Bristol, UK, 1992), pp. 1-250.
2. J. C. Stover, Optical Scattering—Measurement and Analysis, (The International Society for Optical Engineering, Bellingham, Wash., 1995), 2nd ed. pp. 1-321.
3. P. Beckmann and A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Pergamon, New York, 1963), p. 81.
4. J. M. Soto-Crespo and M. Nieto-Vesperinas, “Electromagnetic scattering from very rough random surfaces and deep reflection gratings,” J. Opt. Soc. Am. A 6, 367-384 (1989).
5. M. Saillard and D. Maystre, “Scattering from metallic and dielectric rough surfaces,” J. Opt. Soc. Am. A 7, 982-990 (1990).
6. J. A. Sanchez-Gil and M. Nieto-Vesperinas, “Light scattering from random rough dielectric surfaces,” J. Opt. Soc. Am. A 8, 1270-1285 (1991).
7. M. E. Knotts, T. R. Michel, and K. A. Donnel, “Comparisons of theory and experiment in light scattering from a randomly rough surface,” J. Opt. Soc. Am. A 10, 928 -941 (1993).
8. K. A. O’Donnell and E. R. Mendez, “Experimental study of scattering from characterized random surfaces,” J. Opt. Soc. Am. A 4, 1194-1205 (1987).
9. M. E. Knotts and K. A. Donnel, “Measurements of light scattering by a series of conducting surfaces with one-dimensional roughness,” J. Opt. Soc. Am. A 11, 697-710 (1994).
10. J. M. Bennett and L. Mattson, Introduction to Rough Surface Scattering (Optical Society of America, Washington, D.C., 1989).
11. K. Torrance and E. Sparrow, “Theory for off-specular reflection from rough surfaces,” J. Opt. Soc. Am. 57, 1105-1114 (1967).
12. B. V. Ginneken, M. Stavridi, and J. J. Koenderink, “Diffuse and specular reflectance from rough surfaces,” Appl. Opt. 37, 130-139 (1998).
13. G. Meister, A. Rothkirch, H. Spitzer, and J. Bienlein, “BRDF field studies for remote sensing of urban areas,” Remote Sens. Rev. 19, 37-57 (2000).
14. S. Solheim, B. Hosgood, G. Andreoli, and J. Piironen, “Calibration and characterization of data from the European Go-niometric Facility (EGO),” Report Eur 17268 en. (Space Applications Institute, Joint Research Centre, Ispra, Italy, 1996), pp. 1-31.
15. G. Meister, “Bidirectional reflectance of urban surfaces,” Ph.D. dissertation, (Universität Hamburg, Hamburg, Germany, 2000), pp. 15-78, http://www.sub.uni-hamburg.de/disse/ 253/diss.pdf.
16. M. Oren and S. K. Nayar, “Generalization of the Lambertian model and implications for machine vision,” Int. J. Comput. Vision 14, 227-251 (1995).
17. K. J. Dana, B. v. Ginneken, S. K. Nayar, and J. J. Koenderink, “Reflectance and texture of real world surfaces,” ACM (Assoc. Comput. Mach.) Trans. Graphics 18, 1-34 (1999).
18. A. Rothkirch, G. Meister, B. Hosgood, H. Spitzer, and J. Bienlein, “BRDF measurements on urban materials using laser light,” Remote Sens. Rev. 19, 21-35 (2000).
19. B. Phong, “Illumination for computer generated pictures,” Commun. ACM (Association for Computing Machinery) 18, 311-317 (1975).
20. F. E. Nicodemus, J. C. Richmond, J. J. Hsia, I. W. Ginsberg, and T. Lamperis, “Geometric considerations and nomenclature for reflectance,” Monogram 160:52 (U. S. Department of Commerce, National Bureau of Standards, 1977), pp. 1-33.
21. G. Meister, A. Rothkirch, H. Spitzer, and J. Bienlein, “The shape of the specular peak of rough surfaces,” in Proceedings of the Nineteenth Congress of the International Society for Pho-togrammetry and Remote Sensing (ISPRS), 16-23 July 2000, Amsterdam, Vol. 33 of International Archives of Photogram-metry and Remote Sensing (2000), pp. 852-860.
22. G. Meister, A. Rothkirch, B. Hosgood, H. Spitzer, and J. Bienlein, “Error analysis for BRDF measurements at the European Goniometric Facility,” Remote Sens. Rev. 19, 111-131 (2000).
23. A. Rothkirch, G. Meister, H. Spitzer, and J. Bienlein, “BRDF measurements of urban surface materials at the EGO facility using a laser source,” in Proceedings of the Nineteenth Congress of the International Society for Photogrammetry and Remote Sensing (ISPRS), 16-23 July 2000, Amsterdam, Vol. 33 of International Archives of Photogrammetry and Remote Sensing, (2000), pp. 777-784.
24. S. Brandt, Data Analysis (Springer-Verlag, Berlin, 1999) pp. 1- 652.
25. L. B. Wolff, “On the relative brightness of specular and diffuse reflection,” in Proceedings of IEEE Computer Society Conference on Computer Vision and Pattern Recognition, Seattle, (Institute of Electrical and Electronics Engineers, New York, 1994), pp. 369-376.
26. C. Cox and W. Munk, “Measurement of the roughness of the sea surface from photographs of the sun’s glitter,” J. Opt. Soc. Am. 44, 838-850 (1954).
27. W. Wanner, A. H. Strahler, B. Hu, P. Lewis, J.-P. Muller, X. Li, C. Schaaf, and M. J. Barnsley, “Global retrieval of bidirectional reflectance and albedo over land from EOS modis and MISR data: theory and algorithm,” J. Geophys. Res. 102, 17143-17161 (1997).