Microfabrication and magnetoelectric properties of amorphous magnetic-tunnel-junctions with Co-Fe-B/Al-O/Co-Fe-B hardcore structure

Journal of Magnetism and Magnetic Materials

Volumn 304, Issue 1, 2006, Pages 83-87

  Han, X F ^a   Zhang, X Q ^a   Zeng, Z M ^a   Li, F F ^a   Jiang, L X ^a   Sharif, R ^a   Yao, Y D ^b  

^a INSTITUTE OF PHYSICS   (China)

^b INSTITUTE OF PHYSICS   (Taiwan)

Author keywords

Co60Fe20B20; Magnetic tunnel junction; MRAM; MTJ; TMR; Tunnel magnetoresistance

Indexed keywords

ANNEALING; COBALT ALLOYS; COERCIVE FORCE; RANDOM ACCESS STORAGE; THERMAL EFFECTS; TUNNEL JUNCTIONS;

CO60FE20B20; MAGNETIC TUNNEL JUNCTION; MRAM; TUNNEL MAGNETORESISTANCE;

MAGNETOELECTRIC EFFECTS;

EID: 33646862606     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2006.01.125     Document Type: Article

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