Does the molecular orientation induce an electric dipole in Cu-phthalocyanine thin films?

Journal of Applied Physics

Volumn 99, Issue 9, 2006, Pages

  Yamane, H ^a   Yabuuchi, Y ^a   Fukagawa, H ^a   Kera, S ^b   Okudaira, K K ^b   Ueno, N ^b  

^a CHIBA UNIVERSITY   (Japan)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRONIC STRUCTURE; MOLECULAR ORIENTATION; PHOTOELECTRON SPECTROSCOPY; SURFACE TREATMENT; THICK FILMS; THICKNESS MEASUREMENT;

BAND BENDING-LIKE SHIFT; CU-PHTHALOCYANINEGRAPHITE SYSTEM; ELECTRONIC INTERACTION; MOLECULAR TILT ANGLE; VACUUM-LEVEL POSITION;

THIN FILMS;

EID: 33646859720     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2192978     Document Type: Article

References (24)

1. Conjugated Polymers and Molecular Interfaces: Science and Technology for Photonic and Optoelectronic Applications, edited by, W. R. Salaneck, K. Seki, A. Kahn, and, J.-J. Pireaux, (Marcel Dekker, New York, 2002).
2. H. Ishii, K. Sugiyama, E. Ito, and K. Seki, Adv. Mater. (Weinheim, Ger.) 11, 605 (1999).
3. D. Cahen and A. Kahn, Adv. Mater. (Weinheim, Ger.) 15, 271 (2003).
4. R. Schlaf, B. A. Parkinson, P. A. Lee, K. W. Nebesny, and N. R. Armstrong, Surf. Sci. 420, L122 (1999).
5. I. G. Hill, A. J. Mäkinen, and Z. H. Kafafi, J. Appl. Phys. 88, 889 (2000).
6. H. Peisert, M. Knupfer, T. Schwieger, J. M. Auerhammer, M. S. Golden, and J. Fink, J. Appl. Phys. 0021-8979 10.1063/1.1459620 91, 4872 (2002); M. Knupfer and H. Peisert, Phys. Status Solidi A 0031-8965 10.1002/pssa.200304332 201, 1055 (2004); M. Knupfer and G. Paasch, J. Vac. Sci. Technol. A 23, 1072 (2005).
7. H. Peisert, M. Knupfer, T. Schwieger, J. M. Auerhammer, M. S. Golden, and J. Fink, J. Appl. Phys. 0021-8979 10.1063/1.1459620 91, 4872 (2002); M. Knupfer and H. Peisert, Phys. Status Solidi A 0031-8965 10.1002/pssa.200304332 201, 1055 (2004); M. Knupfer and G. Paasch, J. Vac. Sci. Technol. A 23, 1072 (2005).
8. H. Peisert, M. Knupfer, T. Schwieger, J. M. Auerhammer, M. S. Golden, and J. Fink, J. Appl. Phys. 0021-8979 10.1063/1.1459620 91, 4872 (2002); M. Knupfer and H. Peisert, Phys. Status Solidi A 0031-8965 10.1002/pssa.200304332 201, 1055 (2004); M. Knupfer and G. Paasch, J. Vac. Sci. Technol. A 23, 1072 (2005).
9. N. Hayashi, H. Ishii, Y. Ouchi, and K. Seki, J. Appl. Phys. 0021-8979 10.1063/1.1504495 92, 3784 (2002); E. Ito, J. Appl. Phys. 0021-8979 10.1063/1.1518759 92, 7306 (2002); H. Ishii, Phys. Status Solidi A 201, 1075 (2004).
10. N. Hayashi, H. Ishii, Y. Ouchi, and K. Seki et al., J. Appl. Phys. 0021-8979 10.1063/1.1504495 92, 3784 (2002); E. Ito, J. Appl. Phys. 0021-8979 10.1063/1.1518759 92, 7306 (2002); H. Ishii, Phys. Status Solidi A 201, 1075 (2004).
11. N. Hayashi, H. Ishii, Y. Ouchi, and K. Seki et al., J. Appl. Phys. 0021-8979 10.1063/1.1504495 92, 3784 (2002); E. Ito, J. Appl. Phys. 0021-8979 10.1063/1.1518759 92, 7306 (2002); H. Ishii, Phys. Status Solidi A 201, 1075 (2004).
12. Y. Harada, S. Masuda, and H. Ozaki, Chem. Rev. (Washington, D.C.) 97, 1897 (1997).
13. K. K. Okudaira, S. Hasegawa, H. Ishii, K. Seki, Y. Harada, and N. Ueno, J. Appl. Phys. 85, 6453 (1999).
14. S. Kera, H. Yamane, I. Sakuragi, K. K. Okudaira, and N. Ueno, Chem. Phys. Lett. 364, 93 (2002).
15. H. Yamane, H. Honda, H. Fukagawa, M. Ohyama, Y. Hinuma, S. Kera, K. K. Okudaira, and N. Ueno, J. Electron Spectrosc. Relat. Phenom. 0368-2048 137-140, 223 (2004); S. Kera, H. Yamane, H. Honda, H. Fukagawa, K. K. Okudaira, and N. Ueno, Surf. Sci. 0039-6028 566-568, 571 (2004); H. Fukagawa, H. Yamane, S. Kera, K. K. Okudaira, and N. Ueno, J. Electron Spectrosc. Relat. Phenom. 144-147, 475 (2005).
16. H. Yamane, H. Honda, H. Fukagawa, M. Ohyama, Y. Hinuma, S. Kera, K. K. Okudaira, and N. Ueno, J. Electron Spectrosc. Relat. Phenom. 0368-2048 137-140, 223 (2004); S. Kera, H. Yamane, H. Honda, H. Fukagawa, K. K. Okudaira, and N. Ueno, Surf. Sci. 0039-6028 566-568, 571 (2004); H. Fukagawa, H. Yamane, S. Kera, K. K. Okudaira, and N. Ueno, J. Electron Spectrosc. Relat. Phenom. 144-147, 475 (2005).
17. H. Yamane, H. Honda, H. Fukagawa, M. Ohyama, Y. Hinuma, S. Kera, K. K. Okudaira, and N. Ueno, J. Electron Spectrosc. Relat. Phenom. 0368-2048 137-140, 223 (2004); S. Kera, H. Yamane, H. Honda, H. Fukagawa, K. K. Okudaira, and N. Ueno, Surf. Sci. 0039-6028 566-568, 571 (2004); H. Fukagawa, H. Yamane, S. Kera, K. K. Okudaira, and N. Ueno, J. Electron Spectrosc. Relat. Phenom. 144-147, 475 (2005).
18. S. Kera, Y. Yabuuchi, H. Yamane, H. Setoyama, K. K. Okudaira, A. Kahn, and N. Ueno, Phys. Rev. B 70, 085304 (2004).
19. T. Munakata, T. Sugiyama, T. Masuda, M. Aida, and N. Ueno, Appl. Phys. Lett. 85, 3584 (2004).
20. R. F. Willis, B. Feuerbacher, and B. Fitton, Phys. Rev. B 4, 2441 (1971).
21. C. Ludwig, R. Strohmaier, J. Petersen, B. Gompf, and W. Eisenmenger, J. Vac. Sci. Technol. B 12, 1963 (1994).
22. K. Mitsuke, T. Takami, and K. Ohno, J. Chem. Phys. 91, 1618 (1989).
23. T. Munakata (private communication).
24. W. R. Salaneck, Phys. Rev. Lett. 40, 60 (1978).