Photoelectron fine structures of uppermost valence band for well-characterized ClAl-phthalocyanine ultrathin film: UPS and MAES study

Surface Science

Volumn 566-568, Issue 1-3 PART 1, 2004, Pages 571-578

  Kera, S ^a,b   Yamane, H ^b   Honda, H ^b   Fukagawa, H ^b   Okudaira, K K ^b   Ueno, N ^b  

^a INSTITUTE FOR MOLECULAR SCIENCE   (Japan)

^b CHIBA UNIVERSITY   (Japan)

Author keywords

Diffusion and migration; Metastable induced electron spectroscopy (MIES); Visible and ultraviolet photoelectron spectroscopy; Work function measurements

Indexed keywords

BANDWIDTH; DIES; DIFFUSION; ELECTRON ENERGY LEVELS; ELECTRON SPECTROSCOPY; FERMI LEVEL; MOLECULAR STRUCTURE; MONOLAYERS; PHOTOELECTRON SPECTROSCOPY; POLARIZATION; PRESSURE EFFECTS; SUBSTRATES; THERMAL EFFECTS; VACUUM;

METASTABLE ATOM ELECTRON SPECTROSCOPY (MAES); PHOTOELECTRON FINE STRUCTURES; VISIBLE AND ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; WORK FUNCTION MEASUREMENTS;

ULTRATHIN FILMS;

EID: 4544350255     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.05.110     Document Type: Conference Paper

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