Analysis of magnetic microstructure in MRAM bits by electron holography and Lorentz microscopy

Journal of Electron Microscopy

Volumn 55, Issue 1, 2006, Pages 17-21

  Park, Jong Bong ^a   Park, Gyeong Su ^a   Song, In Yong ^a   Bae, Jun Soo ^b   Lee, Jang Eun ^b   Yoo, Jeong Ho ^c   Murakami, Yasukazu ^c   Shindo, Daisuke ^c  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b SAMSUNG Electronics   (South Korea)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

CoFeBx free layer; Electron holography; Lorentz microscopy; Magnetic flux; MRAM bits; Reconstructed image

Indexed keywords

ELECTRON HOLOGRAPHY; ELECTRONS; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; MAGNETIC DOMAINS; MAGNETIC FIELDS; MAGNETIC RECORDING; MICROSTRUCTURE;

COFEBX-FREE LAYER; CONDITION; FREE LAYERS; LORENTZ MICROSCOPIES; MAGNETIC MICROSTRUCTURES; MAGNETIC-DOMAIN STRUCTURES; MRAM BIT; RECONSTRUCTED IMAGE; RESIDUAL MAGNETIC FIELDS; SPECIMEN POSITION;

MAGNETIC FLUX;

EID: 33646720069     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfl007     Document Type: Article

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