Electrical characterization of single-walled carbon nanotubes with Scanning Force Microscopy

Materials Science and Engineering C

Volumn 15, Issue 1-2, 2001, Pages 149-151

  De Pablo, P J ^a   Martinez M T ^b   Colchero, J ^a   Gomez Herrero J ^a   Maser, W K ^b   De Benito, A M ^b   Muoz, E ^b   Baro A M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b INSTITUTO DE CARBOQUÍMICA   (Spain)

Author keywords

Electrical characterization; Scanning Force Microscopy; Single walled carbon nanotubes

Indexed keywords

ELECTRON TRANSPORT PROPERTIES; INDENTATION; LOADING; MICROSCOPIC EXAMINATION;

METALLIC CANTILEVERS;

CARBON NANOTUBES;

NANOTUBE;

EID: 0034847360     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(01)00264-8     Document Type: Article

References (15)