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Volumn 303, Issue 1, 2006, Pages 34-38

Interlayer exchange coupling dependence of thermal stability parameters in synthetic antiferromagnetic free layers

Author keywords

Interlayer exchange coupling; Magnetic tunnel junctions; Synthetic antiferromagnetic free layers; Thermal stability parameters

Indexed keywords

MAGNETORESISTANCE; NICKEL COMPOUNDS; PARAMETER ESTIMATION; SYNTHESIS (CHEMICAL); THERMODYNAMIC STABILITY; TUNNEL JUNCTIONS;

EID: 33646509884     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2005.10.227     Document Type: Article
Times cited : (11)

References (13)
  • 8
    • 33646509472 scopus 로고    scopus 로고
    • M. Durlam, D. Addie, J. Akerman, B. Butcher, P. Brown, J. Chan, M. DeHerrera, B.N. Engel, B. Feil, G. Grynkewich, J. Janesky, M. Johnson, K. Kyler, J. Molla, J. Martin, K. Nagel, J. Ren, N.D. Rizzo, T. Rodriguez, L. Salter, K. Smith, J.J. Sun, M. Lien, K. Papworth, P. Shah, W. Qin, R. Williams, L. Wise, S. Tehrani, ISSCC Dig. Tech. Papers, 2004 p. 27.
  • 9
    • 33745135081 scopus 로고    scopus 로고
    • W.C. Jeong, J.H. Park, J.H. Oh, G.T. Jeong, H.S. Jeong, K. Kim, Symposium on VLSI Circuits, 2005, p. 184.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.