Density of stacking faults and twin boundaries in ultrafine-grained materials determined by X-ray line profile analysis

TMS Annual Meeting

Volumn 2006, Issue , 2006, Pages 483-490

  Ungár, Tamás ^a   Balogh, Levente ^a   Zhu, Yuntian T ^b   Xu, Cheng ^c   Ribárik, Gábor ^a   Horita, Zenji ^d   Langdon, Terence G ^c  

^a EÖTVÖS LORÁND UNIVERSITY   (Hungary)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

^d KYUSHU UNIVERSITY   (Japan)

Author keywords

Cu Zn alloys; High pressure torsion; Stacking faults; Twinning; X ray line profile analysis

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; DIFFRACTION; DISLOCATIONS (CRYSTALS); GRANULAR MATERIALS; X RAY ANALYSIS;

CU-ZN ALLOYS; HIGH-PRESSURE TORSION; X-RAY LINE PROFILE ANALYSIS;

STACKING FAULTS;

EID: 33646500992     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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