Lensless electron reflection microscopy using a coaxial point-source structure

Ultramicroscopy

Volumn 106, Issue 6, 2006, Pages 480-485

  Hammadi, Zoubida ^a   Morin, Roger ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

Electron point source; Field emission; Lensless electron microscopy; Reflection electron microscopy

Indexed keywords

ELECTRIC POTENTIAL; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON MICROSCOPY; KINETIC ENERGY; LENSES; REFLECTION;

ELECTRON POINT SOURCE; FIELD EMISSIONS; LENSLESS ELECTRON MICROSCOPY; REFLECTION ELECTRON MICROSCOPY;

IMAGING TECHNIQUES;

SILICON;

ARTICLE; ELECTRON; ELECTRON BEAM; ELECTRON MICROSCOPY; FIELD EMISSION; KINETICS; LENSLESS ELECTRON REFLECTION MICROSCOPY; SURFACE PROPERTY;

EID: 33646468973     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.01.001     Document Type: Article

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