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Volumn 77, Issue 25, 2000, Pages 4223-4225

Scanning probe energy loss spectroscopy: Angular resolved measurements on silicon and graphite surfaces

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000331422     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1333404     Document Type: Article
Times cited : (40)

References (19)
  • 14
    • 35949027881 scopus 로고
    • This value was chosen to obtain high signal levels. The energy resolution is limited by the field emission process to values of order 0.2 eV; see J. W. Gadzuk and E. W. Plummer, Rev. Mod. Phys. 45, 487 (1973).
    • (1973) Rev. Mod. Phys. , vol.45 , pp. 487
    • Gadzuk, J.W.1    Plummer, E.W.2
  • 18
    • 85001787564 scopus 로고    scopus 로고
    • note
    • Note also the possibility that electrons may "skip" along the surface under the influence of the field.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.