|
Volumn 77, Issue 25, 2000, Pages 4223-4225
|
Scanning probe energy loss spectroscopy: Angular resolved measurements on silicon and graphite surfaces
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0000331422
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1333404 Document Type: Article |
Times cited : (40)
|
References (19)
|