Development of an advanced low-energy electron diffraction technique using field-emitted electrons from scanning tunneling microscope tips

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 19, Issue 5, 2001, Pages 1874-1878

  Mizuno, Seigi ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON SCATTERING; SCANNING TUNNELING MICROSCOPY;

DIFFRACTION PATTERNS;

LOW ENERGY ELECTRON DIFFRACTION;

EID: 0035441544     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1401751     Document Type: Article

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