SCOPUS 정보 검색 플랫폼

Volumn 88, Issue 17, 2006, Pages

Ferroelectric and reliability properties of metal-organic chemical vapor deposited Pb(Zr0.15Ti0.85) O3 thin films grown in the self-regulation process window

(5) Zhao, Jin Shi a Lee, Hyun Ju a Sim, Joon Seop a Lee, Keun a Hwang, Cheol Seong a

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTALLINE MATERIALS; ELECTROCHEMICAL ELECTRODES; IRIDIUM; LEAD; POLARIZATION; RELIABILITY; RELIABILITY THEORY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

FERROELECTRIC PERFORMANCE; PIR; PRECURSOR INPUT RATIO; SELF-REGULATION PROCESS WINDOW;

FERROELECTRIC CERAMICS;

EID: 33646410984 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2198487 Document Type: Article

Times cited : (8)

References (8)

1
- 33646396970
- Y. Horri, Y. Hikosaka, A. Itoh, K. Matsuura, M. Kurasawa, G. I. Komuro, K. Maruyama, T. Eshita, and S. Kashiwagi, Tech. Dig. - Int. Electron Devices Meet. 2002, 539.
- Tech. Dig. - Int. Electron Devices Meet. , vol.2002 , pp. 539
- Horri, Y.¹ Hikosaka, Y.² Itoh, A.³ Matsuura, K.⁴ Kurasawa, M.⁵ Komuro, G.I.⁶ Maruyama, K.⁷ Eshita, T.⁸ Kashiwagi, S.⁹

2
- 33646400220
- J. M. Koo, B. S. Seo, S. P. Kim, S. M. Shin, J. H. Lee, H. S. Baik, J. H. Lee, J. H. Lee, B. J. Bae, J. E. Lim, D. C. Yoo, S. O. Park, H. S. Kim, H. Han, S. G. Baik, J. Y. Choi, Y. J. Park, and Y. S. Park, Trans. Inst. Electr. Eng. Jpn., Part C 2005, 539.
- Trans. Inst. Electr. Eng. Jpn., Part C , vol.2005 , pp. 539
- Koo, J.M.¹ Seo, B.S.² Kim, S.P.³ Shin, S.M.⁴ Lee, J.H.⁵ Baik, H.S.⁶ Lee, J.H.⁷ Lee, J.H.⁸ Bae, B.J.⁹ Lim, J.E.¹⁰ Yoo, D.C.¹¹ Park, S.O.¹² Kim, H.S.¹³ Han, H.¹⁴ Baik, S.G.¹⁵ Choi, J.Y.¹⁶ Park, Y.J.¹⁷ Park, Y.S.¹⁸

3
- 3242700791
- H. Funakubo, G. Asano, T. Ozeki, H. Machida, T. Yoneyana, and Y. Takamatsu, J. Electrochem. Soc. 151, C463 (2004).
- (2004) J. Electrochem. Soc. , vol.151 , pp. 463
- Funakubo, H.¹ Asano, G.² Ozeki, T.³ MacHida, H.⁴ Yoneyana, T.⁵ Takamatsu, Y.⁶

4
- 0026932008
- G. J. Mormans, P. J. wan Veldhoven, and M. De Keijser, J. Cryst. Growth 123, 537 (1992).
- (1992) J. Cryst. Growth , vol.123 , pp. 537
- Mormans, G.J.¹ Wan Veldhoven, P.J.² De Keijser, M.³

5
- 2942556727
- J. S. Zhao, D. Y. Park, M. J. Seo, and C. S. Hwang, J. Electrochem. Soc. 151, C283 (2004).
- (2004) J. Electrochem. Soc. , vol.151 , pp. 283
- Zhao, J.S.¹ Park, D.Y.² Seo, M.J.³ Hwang, C.S.⁴

6
- 17144461920
- S. Jeong, J. S. Zhao, H. R. Kim, D. Y. Park, C. S. Hwnag, Y. K. Han, C. H. Yang, K. Y. Oh, S.-H. Kim, D. S. Lee, and J. W. Ha, J. Electrochem. Soc. 150, C678 (2003).
- (2003) J. Electrochem. Soc. , vol.150 , pp. 678
- Jeong, S.¹ Zhao, J.S.² Kim, H.R.³ Park, D.Y.⁴ Hwnag, C.S.⁵ Han, Y.K.⁶ Yang, C.H.⁷ Oh, K.Y.⁸ Kim, S.-H.⁹ Lee, D.S.¹⁰ Ha, J.W.¹¹

7
- 0004031650
- Chapman and Hall, London
- A. J. Moulson and J. M. Herbert, Electroceramics (Chapman and Hall, London, 1990), p. 283.
- (1990) Electroceramics , pp. 283
- Moulson, A.J.¹ Herbert, J.M.²

8
- 20944439624
- M. Kurasawa and P. C. Mclntyre, J. Appl. Phys. 97, 104110 (2005).
- (2005) J. Appl. Phys. , vol.97 , pp. 104110
- Kurasawa, M.¹ McLntyre, P.C.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.