Tunnel magnetoresistive current sensors for IC testing

Sensors and Actuators, A: Physical

Volumn 129, Issue 1-2 SPEC. ISS., 2006, Pages 69-74

  Le Phan, Kim ^a   Boeve, Hans ^a   Vanhelmont, Frederik ^a   Ikkink, Ton ^a   de Jong, Frans ^a   de Wilde, Hans ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Current sensor; IC testing; Magnetic tunnel junction; MRAM; Tunnel magnetoresistance

Indexed keywords

COST EFFECTIVENESS; ELECTRIC CURRENTS; ELECTRONIC EQUIPMENT; INTEGRATED CIRCUIT LAYOUT; MAGNETORESISTANCE; RANDOM ACCESS STORAGE;

IC TESTING; MAGNETIC RANDOM ACCESS MEMORY (MRAM); MAGNETIC TUNNEL JUNCTION; SENSOR GEOMETRIES; TUNNEL MAGNETORESISTANCE (TMR);

SENSORS;

EID: 33646229296     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2005.09.046     Document Type: Article

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