Built-in current sensor for IDDQ testing in deep submicron CMOS

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 135-142

  Calin, T ^a   Anghel, L ^a   Nicolaidis, M ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPARATOR CIRCUITS; ELECTRIC CURRENTS; ELECTRIC POWER SUPPLIES TO APPARATUS; LOGIC CIRCUITS; MOSFET DEVICES; SEMICONDUCTOR SWITCHES; SENSORS;

BIAS CURRENTS; BUILT-IN CURRENT SENSOR; DEEP SUBMICRON CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0032644939     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (13)