Defect characterization of Si-doped GaN films by a scanning near-field optical microscope-induced photoluminescence

Applied Physics Letters

Volumn 88, Issue 16, 2006, Pages

  Yoshikawa, M ^a   Sugie, R ^a   Murakami, M ^a   Matsunobe, T ^a   Matsuda, K ^a   Ishida, H ^a  

^a TORAY RESEARCH CENTER INC   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; DEFECTS; GALLIUM NITRIDE; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PHOTOLUMINESCENCE;

SEMICONDUCTOR FILMS; THREADING DISLOCATIONS; ULTRAVIOLET LASERS; YELLOW LUMINESCENCE;

THIN FILMS;

EID: 33646203459     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2190270     Document Type: Article

References (19)

1. S. Nakamura, T. Mukai, and M. Senoh, J. Appl. Phys. 76, 8189 (1994).
2. S. Nakamura, M. Senoh, N. Iwasa, and S. Nagahama, Jpn. J. Appl. Phys., Part 1 34, 794 (1995).
3. S. Nakamura, M. Senoh, N. Iwasa, S. Nagahama, T. Yamada, and T. Mukai, Jpn. J. Appl. Phys., Part 1 34, 1332 (1995).
4. T. Sugahara, H. Sato, M. Hao, Y. Naoi, S. Kurai, S. Tottori, K. Yamashita, K. Nishino, L. T. Romano, and S. Sakai, Jpn. J. Appl. Phys., Part 2 37, L398 (1998).
5. S. Evoy, H. G. Craighead, S. Keller, U. K. Mishra, and S. P. DenBaars, J. Vac. Sci. Technol. B 17, 29 (1999).
6. S. J. Rosner, E. C. Carr, M. J. Ludowise, G. Girolami, and H. I. Erikson, Appl. Phys. Lett. 70, 420 (1997).
7. Near-Field Nano/Atom Optics and Technology, edited by, M. Ohtsu, (Springer, Tokyo, 1998).
8. M. Yoshikawa, M. Kunzer, J. Wagner, H. Obloh, P. Schlotter, R. Schmidt, N. Herres, and U. Kaufmann, J. Appl. Phys. 86, 4400 (1999).
9. M. Holts, W. M. Duncan, S. Zollner, and R. Lie, J. Appl. Phys. 88, 2523 (2000).
10. R. G. Yacobi and D. B. Holt, Cathodoluminescence Microscopy of Inorganic Solids (Plenum, New York, 1990).
11. M. Yoshikawa, K. Iwagami, and H. Ishida, J. Appl. Phys. 51, 1693 (1998).
12. M. Yoshikawa, K. Matsuda, Y. Yamaguchi, T. Matsunobe, Y. Nagasawa, H. Fjino, and T. Yamane, J. Appl. Phys. 92, 7153 (2002).
13. R. Sugie, M. Yoshikawa, and H. Harima, in Proceedings of the 2003 International Conference Solid State Devices and Materials, Tokyo, (unpublished).
14. K. Karrai and R. D. Grober, Appl. Phys. Lett. 66, 1842 (1995).
15. D. N. Davydov, K. B. Shelimov, T. L. Haslett, and M. Moskovits, Appl. Phys. Lett. 75, 1796 (1999).
16. E. Calleja, F. J. Sanchez, D. Basak, M. A. Sanchez-Garcia, E. Munoz, I. Izpura, F. Calle, J. M. G. Tijero, J. L. Sanchez-Rojas, B. Beaumont, P. Lorenzini, and P. Gibart, Phys. Rev. B 55, 4689 (1997).
17. E. F. Schubert, I. D. Goepfert, and J. M. Redwing, Appl. Phys. Lett. 71, 3224 (1997).
18. R. Sugie, K. Matsuda, M. Yoshikawa, Y. Nagasawa, and H. Harima, in Proceeding of the International Conference on Raman Spectroscopy, edited by, J. Mink, G. Jalsovszky, and G. Keresztury (Wiley, New York, 2002), p. 515.
19. H. Harima, J. Phys.: Condens. Matter 14, R967 (2002).