Characterization of three-dimensional crystallographic distributions using polychromatic X-ray microdiffraction

Scripta Materialia

Volumn 55, Issue 1 SPEC. ISS., 2006, Pages 57-62

  Ice, G E ^a   Pang, J W L ^a   Barabash, R I ^a   Puzyrev, Y ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Microdiffraction; Synchrotron radiation; X ray diffraction

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; STRAIN; SYNCHROTRON RADIATION; TENSORS; X RAY DIFFRACTION; X RAYS;

CRYSTALLOGRAPHIC DISTRIBUTIONS; DIFFERENTIAL APERTURE MICROSCOPY; DISLOCATION TENSORS; LOCAL ELASTIC STRAIN; MICRODIFFRACTION; X-RAY BEAMS;

CRYSTAL STRUCTURE;

EID: 33646193507     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2006.02.046     Document Type: Article

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