High-temperature ferroelectric domain stability in epitaxial Pb Zr0.2 Ti0.8 O3 thin films

Applied Physics Letters

Volumn 88, Issue 16, 2006, Pages

  Paruch, P ^a,b   Triscone, J M ^a  

^a UNIVERSITY OF GENEVA   (Switzerland)

^b Laboratory of Atomic and Solid State Physics and Sibley School of Mechanical and Aerospace Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOMAIN-WALL CONFIGURATION; FERROELECTRIC DOMAIN STABILITY; FILM SURFACE; IN-PLANE FILM-SUBSTRATE LATTICE-MISMATCH-INDUCED STRAIN;

ATOMIC FORCE MICROSCOPY; FERROELECTRIC MATERIALS; HEAT TREATMENT; SUPERCONDUCTING TRANSITION TEMPERATURE; SURFACE ROUGHNESS; THERMAL CYCLING;

THIN FILMS;

EID: 33646180011     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2196482     Document Type: Article

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