-
1
-
-
10044252204
-
Performance modeling of JWST near infrared multi-object spectrograph
-
Glasgow, United Kingdom
-
F. Zamkotsian and K. Dohlen, "Performance modeling of JWST near infrared multi-object spectrograph," in Proceedings of the SPIE conference on Astronomical Telescopes and Instrumentation 2004, Proc. SPIE 5487, (Glasgow, United Kingdom), 2004.
-
(2004)
Proceedings of the SPIE Conference on Astronomical Telescopes and Instrumentation 2004, Proc. SPIE
, vol.5487
-
-
Zamkotsian, F.1
Dohlen, K.2
-
2
-
-
0038741010
-
Microshutter arrays for the NGST NIRSpec
-
Hawaii, USA
-
H. Moseley, S. Aslam, M. Baylor, K. Blumenstock, R. Boucarut, A. Erwin, R. Fettig, D. Frauz, T. Hadjimichael, J. Hein, A. Kutyrev, D. M. M. Li, C. Monroy, and D. Schwinger, "Microshutter arrays for the NGST NIRSpec," in Proceedings of the SPIE conference, on Astronomical Telescopes and Instrumentation, 2002, Proc. SPIE 4850, (Hawaii, USA), 2002.
-
(2002)
Proceedings of the SPIE Conference, on Astronomical Telescopes and Instrumentation, 2002, Proc. SPIE
, vol.4850
-
-
Moseley, H.1
Aslam, S.2
Baylor, M.3
Blumenstock, K.4
Boucarut, R.5
Erwin, A.6
Fettig, R.7
Frauz, D.8
Hadjimichael, T.9
Hein, J.10
Kutyrev, A.11
Li, D.M.M.12
Monroy, C.13
Schwinger, D.14
-
3
-
-
0038735268
-
Characterization of MOEMS devices for the instrumentation of next generation space telescope
-
San Jose, USA
-
F. Zamkotsian, J. Gautier, and P. Lanzoni, "Characterization of MOEMS devices for the instrumentation of next generation space telescope," in Proceedings of the SPIE conference on MOEMS 2003, Proc. SPIE 4980, (San Jose, USA), 2003.
-
(2003)
Proceedings of the SPIE Conference on MOEMS 2003, Proc. SPIE
, vol.4980
-
-
Zamkotsian, F.1
Gautier, J.2
Lanzoni, P.3
-
4
-
-
0036248275
-
Applications of SOI-based optical MEMS
-
W. Noell, P.-A. Clerc, L. Dellmann, B. Guldimann, H. Herzig, O. Manzardo, C. Marxer, K. Weible, R. Dändliker, and N. de Rooij, "Applications of SOI-based optical MEMS," IEEE Journal of Selected Topics in Quantum Electronics Vol. 8, pp. 148-154, 2002.
-
(2002)
IEEE Journal of Selected Topics in Quantum Electronics
, vol.8
, pp. 148-154
-
-
Noell, W.1
Clerc, P.-A.2
Dellmann, L.3
Guldimann, B.4
Herzig, H.5
Manzardo, O.6
Marxer, C.7
Weible, K.8
Dändliker, R.9
De Rooij, N.10
-
6
-
-
3042823621
-
A clean wafer-scale chip-release process without dicing based on vapor phase etching
-
Maastricht, The Netherlands
-
T. Overstolz, P. A. Clerc, W. Noell, M. Zickar, and N. F. de Rooij, "A clean wafer-scale chip-release process without dicing based on vapor phase etching," in Technical Digest of the 17th IEEE International Conference on Micro Electro Mechanical Systems, pp. 717-720. (Maastricht, The Netherlands), 2004.
-
(2004)
Technical Digest of the 17th IEEE International Conference on Micro Electro Mechanical Systems
, pp. 717-720
-
-
Overstolz, T.1
Clerc, P.A.2
Noell, W.3
Zickar, M.4
De Rooij, N.F.5
-
7
-
-
0036851061
-
Large-displacement vertical microlens scanner with low driving voltage
-
S. Kwon, V. Milanovic, and L. P. Lee, "Large-displacement vertical microlens scanner with low driving voltage," IEEE Photonics Letters Vol. 14, p. 1572-1574, 2002.
-
(2002)
IEEE Photonics Letters
, vol.14
, pp. 1572-1574
-
-
Kwon, S.1
Milanovic, V.2
Lee, L.P.3
-
8
-
-
21844433999
-
Static and dynamic MOEMS characterization by phase-shifting and time-averaged inteferoinetry
-
A. Liotard, S. Muratet, F. Zamkotsiam, and J. Fourniols, "Static and dynamic MOEMS characterization by phase-shifting and time-averaged inteferoinetry," in Proceedings of the SPIE conference on MOEMS 2005, Proc. SPIE 5716, 2005.
-
(2005)
Proceedings of the SPIE Conference on MOEMS 2005, Proc. SPIE
, vol.5716
-
-
Liotard, A.1
Muratet, S.2
Zamkotsiam, F.3
Fourniols, J.4
|