Optical characterization of Srm-3Bi4TimO3m+3 (m = 4,5,6) thin films grown by pulsed laser deposition method

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 35, Issue 6 A, 1996, Pages

  Tachiki, M ^a   Yamamuro, K ^a   Kobayashi, T ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; EPITAXIAL GROWTH; OPTICAL PROPERTIES; OXIDES; PULSED LASER APPLICATIONS; THIN FILMS; X RAY DIFFRACTION;

BISMUTH LAYERED-STRUCTURE OXIDE; PULSED LASER DEPOSITION SPECTRA; TRANSMISSION SPECTRA;

FERROELECTRIC MATERIALS;

EID: 0030168299     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.l719     Document Type: Article

References (11)