A technique to assess the reliability of the second-order susceptibility determination of thin films

Optics Communications

Volumn 261, Issue 2, 2006, Pages 359-367

  Siltanen, Mikael ^a   Kauranen, Martti ^a  

^a TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

Non linear optics; Second harmonic generation; Susceptibility; Thin films

Indexed keywords

LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; NONLINEAR OPTICS; PROBLEM SOLVING; RELIABILITY; SECOND HARMONIC GENERATION; TENSORS; THIN FILMS;

NON-LINEAR MEASUREMENTS; SUSCEPTIBILITY TENSOR; THEORETICAL MODEL;

MAGNETIC SUSCEPTIBILITY;

EID: 33646075120     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2005.12.007     Document Type: Article

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