New polarization techniques for precise characterization of second-order thin films

Journal of Nonlinear Optical Physics and Materials

Volumn 12, Issue 4, 2003, Pages 513-523

  Cattaneo, Stefano ^a   Siltanen, Mikael ^a   Kauranen, Martti ^a  

^a TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

LB films; Second harmonic generation; Surfaces; Susceptibility tensor; Thin films

Indexed keywords

HARMONIC GENERATION; LANGMUIR BLODGETT FILMS; NONLINEAR OPTICS; REGRESSION ANALYSIS; SURFACES; TENSORS;

FUNDAMENTAL FREQUENCIES; INDEPENDENT MEASUREMENT; POLARIZATION TECHNIQUES; SECOND HARMONICS; SECOND ORDERS; SUSCEPTIBILITY TENSORS; THEORETICAL MODELING;

THIN FILMS;

EID: 1042267684     PISSN: 02188635     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218863503001614     Document Type: Article

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