A regression technique to analyze the second-order nonlinear optical response of thin films

Journal of Chemical Physics

Volumn 121, Issue 1, 2004, Pages 1-4

  Siltanen, Mikael ^a   Cattaneo, Stefano ^a   Vuorimaa, Elina ^a   Lemmetyinen, Helge ^a   Katz, Thomas J ^b   Phillips, Karen E S ^b,c   Kauranen, Martti ^a  

^a TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

^b Och Spine at New York Presbyterian Hospitals   (United States)

^c CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC-DIPOLE APPROXIMATION; LEAST SQUARES REGRESSION; NONLINEAR RESPONSE; SUSCEPTIBILITY TENSOR;

ANISOTROPY; LANGMUIR BLODGETT FILMS; LEAST SQUARES APPROXIMATIONS; LINEAR EQUATIONS; MATHEMATICAL MODELS; NONLINEAR OPTICS; PHOTOMULTIPLIERS; POLARIZATION; Q SWITCHED LASERS; REFRACTION; REGRESSION ANALYSIS; SECOND HARMONIC GENERATION; TENSORS;

THIN FILMS;

EID: 3142732111     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1767151     Document Type: Article

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