Tensor analysis of the second-order nonlinear optical susceptibility of chiral anisotropic thin films

Journal of Chemical Physics

Volumn 112, Issue 3, 2000, Pages 1497-1502

  Kauranen, Martti ^a,b   Van Elshocht, Sven ^a   Verbiest, Thierry ^a   Persoons, André ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000952723     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.480716     Document Type: Article

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26. We take the opportunity to correct a small error in Ref. 23 where the magnitudes of the isotropic combinations zzz and zxx + zyy were mixed up. The values in Table II are the correct ones.