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Volumn 246, Issue 1, 2006, Pages 249-253
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On the analysis of SAXS data from oriented 2D cylindrical mesostructures measured in symmetric reflection
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Author keywords
Mesostructure; Reflectivity; SAXS
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Indexed keywords
COMPUTER SIMULATION;
CRYSTAL LATTICES;
CYLINDERS (SHAPES);
INTERFACES (MATERIALS);
MATHEMATICAL MODELS;
NANOSTRUCTURED MATERIALS;
REFLECTION;
SURFACE ACTIVE AGENTS;
SYNCHROTRONS;
THIN FILMS;
X RAY SCATTERING;
MESOSTRUCTURES;
NANOSCALED CYLINDRICAL SYSTEMS;
POLYDISPERSITY;
SCATTERING CURVES;
DATA REDUCTION;
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EID: 33645886072
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2005.12.038 Document Type: Article |
Times cited : (5)
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References (14)
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